Universität Wien

260101 VO "Microscopy at the Bottom": Applications of Aberration Corrected Low Voltage TEM (2010S)

2.50 ECTS (2.00 SWS), SPL 26 - Physik

Teil 1: Do, 15. April 2010, 15:15 Uhr
Teil 2: Di, 20. April 2010, 15:15 Uhr
Josef-Stefan-Hörsaal, Strudlhofgasse 4, 3.Stk., 1090 Wien

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Language: English

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PD250,310

Last modified: We 22.01.2025 00:20