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260102 UE Introduction into Electron Microscopy II - Exercises (2014S)

2.50 ECTS (1.00 SWS), SPL 26 - Physik

Continuous assessment of course work

Vorbesprechung: MO 03.03.2014 10.00-11.00 Ort: Josef-Stefan-Hörsaal, Boltzmanngasse 5, 3. Stk., 1090 Wien

MO wtl von 10.03.2014 bis 30.06.2014 11.00-12.00 Ort: Seminarraum, Zi. 3354A, Boltzmanngasse 5, 3. Stk., 1090 Wien

Details

max. 12 participants

Language: German

Lecturers

Classes

Currently no class schedule is known.

Information

Aims, contents and method of the course

Fields of applications and methods of electron microscopical investigations, electron optics of the microscops, matter waves, electron diffraction and images of crystal structures, quantum interferometry with the electron microscope, demonstration of all electron microscopes of the Faculty of Physics during operation.

Assessment and permitted materials

Oral examination

Minimum requirements and assessment criteria

Electron microscopical investigations are not only used in materials physics but are also of great importance in nanotechnology, biology and medicine. The aim is to understand the scientific background of the electron microscopical methods with a specific focus on quantum interferometry with the electron microscope.

Examination topics

Lecture, discussions, demonstration of the microscopes

Reading list

D. B. Williams, C. B. Carter, Transmission Electron Microscopy (Plenum Press)
B. Fultz and J. Howe, Transmission Electron Microscopy and Diffractometry of Materials (Springer)
L. Reimer, Transmission Electron Microscopy (Springer)
M. De Graef, Conventional Transmission Electron Microscopy (Cambridge Univ. Press)

Association in the course directory

MF 2, MF 4, MaG 6, MaG 9, MaG 13, LA-Ph212(3)

Last modified: Fr 31.08.2018 08:55