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260118 VO Ion Beam Analysis of Materials I (2005W)
Ion Beam Analysis of Materials I
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n.Ü., Vorbesprechung: Di 4.10.2005, 12:00, VERA-SR, Inst. f. Isotopenforschung und Kernphysik, Währinger Straße 17, Hoftrakt, 1090 Wien.
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PD250,310;LA-Ph212(1),PL251c,1,3,4,PL251d
Last modified: Fr 31.08.2018 08:55
Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-10 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA) and Particle Induced X-Ray Emission (PIXE) will be discussed in detail.