260195 VO Ion beam analysis of materials II (2007S)
Ion beam analysis of materials II
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Vorbesprechung: Di 6.3.2007, 12:00, VERA-SR, Währinger Straße 17, Hoftrakt, 1. Stk., 1090 Wien
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PD250,310;LA-Ph212(1)
Last modified: Fr 31.08.2018 08:55
Ion beam analysis (IBA) utilizes MeV ion beams to determine non-destructively the elemental composition of the near-surface region of solids (0-1 micrometer). Rutherford-backscattering (RBS), Elastic Recoil Detection Analysis (ERDA) and Particle Induced X-Ray Emission (PIXE) will be discussed in detail.