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270084 PR Practice in Tunnelling Microscopy (2016W)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from We 22.06.2016 08:00 to Su 16.10.2016 23:59
- Deregistration possible until Su 16.10.2016 23:59
Details
max. 15 participants
Language: German
Lecturers
Classes
Currently no class schedule is known.
Information
Aims, contents and method of the course
Scanning-Tunnelling Microscopy (STM), Atomic Force Microscopy (AFM)
Assessment and permitted materials
Evaluation: experimental work, quality of protocols, final presentation in group seminar.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Minimum requirements and assessment criteria
Practical course in tunnelling microscopy. Samples are partly dedicated to this course; partly they come from research activities of the group. The concrete experiments during your lab hence depend on the respective topic. Techniques also encompass imaging from force-distance-curves (for instance Peak Force QNM).
Examination topics
Independent measuring within the group after training on the equipment.
Reading list
Association in the course directory
AN-4, A.5;
Last modified: Mo 07.09.2020 15:41