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270084 PR Scanning probe microscopic (2019W)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Su 01.09.2019 08:00 to We 25.09.2019 23:59
- Deregistration possible until We 25.09.2019 23:59
Details
max. 6 participants
Language: German
Lecturers
Classes
Agreed upon individually. After the registration period has ended, you will receive a link to a Doodle poll. That will be the basis for scheduling the individual course. You will spend one week in the lab. Courses can also take place during teaching holidays.
Information
Aims, contents and method of the course
Gaining practical experience in Atomic Force Microscopy (AFM). Depending on the availability of samples and access to the machine(s), the course may also comprise Scanning-Tunnelling Microscopy (STM) and AFM/Raman Microscopy.
Assessment and permitted materials
Evaluation: experimental work, quality of protocols, final presentation in group seminar.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Minimum requirements and assessment criteria
Practical course in tunnelling microscopy. Samples are partly dedicated to this course; partly they come from research activities of the group. The concrete experiments during your lab hence depend on the respective topic. Techniques also encompass imaging from force-distance-curves (for instance Peak Force QNM).
Examination topics
Independent measuring within the group after training on the equipment.
Reading list
Association in the course directory
AN-4, A.5
Last modified: Mo 13.01.2020 14:48