270203 PR Scanning Microscopy Techniques & Functional Sensing Interfaces (2024S)
Continuous assessment of course work
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MIXED
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Sa 03.02.2024 08:00 to Mo 26.02.2024 23:59
- Deregistration possible until Mo 26.02.2024 23:59
Details
max. 6 participants
Language: German
Lecturers
Classes
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Information
Aims, contents and method of the course
Gaining practical experience in Atomic Force Microscopy (AFM). Depending on the availability of samples and access to the machine(s), the course may also comprise Scanning-Tunnelling Microscopy (STM) and AFM/Raman Microscopy.
Assessment and permitted materials
Evaluation: experimental work, quality of protocols, final presentation in group seminar.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Your practical work contributes to 50% of the overall score, the protocol 25% and the seminar lecture 25%. You have to reach 75% to pass.
Minimum requirements and assessment criteria
Practical course in tunnelling microscopy. Samples are partly dedicated to this course; partly they come from research activities of the group. The concrete experiments during your lab hence depend on the respective topic. Techniques also encompass imaging from force-distance-curves (for instance Peak Force QNM).
Examination topics
Independent measuring within the group after training on the equipment.
Reading list
Association in the course directory
AN-4, A.5, CH-MAT-05, WA5, LMC C1, LMC D1
Last modified: Mo 04.03.2024 16:26