Warning! The directory is not yet complete and will be amended until the beginning of the term.
270305 SE+UE Modern Techniques in Materials and Solid State Chemistry (2018S)
Continuous assessment of course work
Labels
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Th 01.02.2018 08:00 to Su 11.03.2018 23:59
- Deregistration possible until Su 11.03.2018 23:59
Details
max. 8 participants
Language: German
Lecturers
Classes
Vorbesprechung 7. März 2018 Fak für Physik, Raum 32a im Erdgeschoss neben Aufzug in die ZBfPhysik (für alle Teilnehmer unbedingt nötig zur Festlegung der gemeinsamen Praktikumstermine: ein Halbtag pro Woche durch das ganze Semester)
Information
Aims, contents and method of the course
Assessment and permitted materials
The judging of students is derived from the activity in seminars, the engagement during the experiments, and from the result of final questioning.
Minimum requirements and assessment criteria
Correct handling of modern research facilities, good physico/chemical understanding, suitable documentation of experiments, and the specific preparation for master work and/or a doctoral thesis in materials chemistry.
Examination topics
The lab course uses modern audio-visual tools and state-of-the-art research instruments.
Reading list
1) M.M. Woolfson, "An Introduction to X-ray Crystallography", Cambridge University Press, Online Publication January 2010; Online ISBN:9780511622557 ; Paperback ISBN:97805214235952) G. H. Stout and L.H. Jensen "X-ray Structure Determination, A Practical Guide", 2nd Ed. J. Wiley&Sons, NY, 1989
Association in the course directory
PC-1, MC-2, B.2, D.2, Doktorat
Last modified: Mo 07.09.2020 15:42
These techniques will be demonstrated on selected examples.
The course is highly recommended as a specific preparation for master work and/or a doctoral thesis in materials chemistry.Contents (part in Physical Chemistry): Introduction to production and properties of X-rays. Fundamental principles of X-ray diffraction. Indexation of X-ray powder patterns (Example 1). Techniques and interpretation of powder diffraction data; qualitative and quantitative analysis of crystalline powders (Rietveld analysis) as well as ab-initio determination of an unknown crystal structure from X-ray powder data (Example 2). Methods of solving the phase problem. Direct methods for structure determination and refinement from X-ray single crystal data (Example 3). Introduction to EPMA (Electron Microprobe Analysis; Example 4).
The introductory course is accompanied by tutored exercises on these major tasks (1-4) and by concomitant training in various computer programs (Fullprof, Oscail, Atoms).