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280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2017W)
Continuous assessment of course work
Labels
Preliminary meeting (compulsory) Tue 11.10.2016, 15:00-16:00, 2C315Students, who are absent during the preliminary meeting will be unsubscribed.Block course 17.2. - 24.2.2017Basic knowledge of Scanning Electron Microscopy is required ("MA-ERD-2 Instrumentelle Analytik in den Geowissenschaften" or certificate of equivalent education)
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Th 14.09.2017 10:00 to Th 28.09.2017 23:59
- Registration is open from Tu 03.10.2017 10:00 to Th 19.10.2017 23:59
- Deregistration possible until Th 19.10.2017 23:59
Details
max. 10 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
Block course 16. - 23. Feb 2018
- Wednesday 11.10. 15:00 - 16:00 Hörsaal 1 2A120 1.OG UZA II Geo-Zentrum (Kickoff Class)
- Friday 16.02. 09:30 - 12:00 Eberhard Clar Saal Geologie 2B204 2.OG UZA II
- Friday 16.02. 13:30 - 14:45 Eberhard Clar Saal Geologie 2B204 2.OG UZA II
Information
Aims, contents and method of the course
Assessment and permitted materials
Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 20. April 2018).
During the practicals every student independently collects an SE- and BSE-image after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 20. April 2018).
Minimum requirements and assessment criteria
Permanent attendance during the practicals is required for a positive certificate.
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 20. April 2018).
Assessment criterion: Written workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
(Submission of the workflow protocol until 20. April 2018).
Examination topics
practicals: individual work under supervision at the Quanta 3D FEG instrument.
Written Workflow-protocol covering the practical parts (SE- BSE-imaging; Generating a cross section using the focused ion beam)
Written Workflow-protocol covering the practical parts (SE- BSE-imaging; Generating a cross section using the focused ion beam)
Reading list
Association in the course directory
Last modified: Th 31.10.2024 00:16
Students are able to operate the FIB-SEM instrument for electron imaging at high spatial resolution and for FIB applications. They know the special instrumental features of the FIB-SEM instrument in theory and practice. The students learn to collect electron optical images using different detectors (SED, BSED, FSD, STEM) and to perform cross-sections using FIB. Furthermore, the students are introduced to the analytical basics of EBSD- and EDX-analysis. They are able to use the different methods of microstructure analysis for working at individual questions in geomaterials research.Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; micromanipulator; EBSD; FSD