Universität Wien
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280085 UE MA-ERD-17.2 Field emission scanning electron microscopy and ion beam applications (PI) (2018W)

3.00 ECTS (3.00 SWS), SPL 28 - Erdwissenschaften, Meteorologie - Geophysik und
Continuous assessment of course work
Moodle

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 10 participants
Language: German, English

Lecturers

Classes (iCal) - next class is marked with N

Block course 15. - 27. Feb 2019, UZA2U120

theoretical part:
Fri 15.02.2019, 9:30 - 12:00 and 13:30 - 14:45; room UZA2C193

practical part (2 groups)
Mon 18.02.2019, 9:00 – 12:15; 13:00 - 16:15; room 2U120 (group 1)
Tue 19.02.2019, 9:00 – 12:15; 13:00 - 16:15; room 2U120 (group 1)
Wed 20.02.2019, 9:00 – 12:15 (group 1)

Mon 25.02.2019, 9:15 – 12:30; 13:45 - 17:00; room 2U120 (group 2)
Tue 26.02.2019, 13:45 - 17:00; room 2U120 (group 2)
Wed 27.02.2019, 9:15 – 12:30; 13:45 - 17:00; room 2U120 (group 2)

Basic knowledge of Scanning Electron Microscopy is required ("MA-ERD-2 Instrumentelle Analytik in den Geowissenschaften" or certificate of equivalent education)

  • Monday 08.10. 15:00 - 16:00 Seminarraum Geochemie 2C193 1.OG UZA II (Kickoff Class)
  • Friday 15.02. 09:30 - 12:00 Seminarraum Geochemie 2C193 1.OG UZA II
  • Friday 15.02. 13:30 - 14:45 Seminarraum Geochemie 2C193 1.OG UZA II

Information

Aims, contents and method of the course

Aims:
Students are able to operate the FIB-SEM instrument for electron imaging at high spatial resolution and for FIB applications. They know the special instrumental features of the FIB-SEM instrument in theory and practice. The students learn to collect electron optical images using different detectors (SED, BSED, FSD, STEM) and to perform cross-sections using FIB. Furthermore, the students are introduced to the analytical basics of EBSD- and EDX-analysis. They are able to use the different methods of microstructure analysis for working at individual questions in geomaterials research.

Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; usage of the micromanipulator; EBSD; FSD

Assessment and permitted materials

Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals (UE SEM, UE FIB); originally composed workflow protocol of the practicals.
Submission of the workflow protocol until 5. April 2019.

Minimum requirements and assessment criteria

Permanent attendance during the practicals is required for a positive certificate.
Assessment criteria: Originally composed workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
Submission of the workflow protocol until 5. April 2019.

Examination topics

practicals: individual work under supervision at the Quanta 3D FEG instrument;
Original composition of a workflow-protocol covering the practical parts UE SEM and UE FIB.

Reading list

Association in the course directory

Last modified: Sa 02.04.2022 00:25