Universität Wien
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280122 UE MA-ERD-W-3.3 Field Emission Ecanning Electron Microscopy and Ion Beam Applications (PI) (2021S)

3.00 ECTS (3.00 SWS), SPL 28 - Erdwissenschaften, Meteorologie - Geophysik und
Continuous assessment of course work
ON-SITE
Moodle

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 10 participants
Language: German, English

Lecturers

Classes (iCal) - next class is marked with N

Preliminary meeting on 16. March 2021, 15:30-16:30 (ONLINE via BB Collaborate).
Attendance of the preliminary meeting is compulsory!!!

The course will be blocked.
Theory (ONLINE via Zoom):
Fri 27. August 2021, 9:30 - 12:00 and 13:15 - 14:30

Practical part Group 1 (ON SITE, room UZA2U120):
Mon 30. August 2021, 9:15 - 12:30 and 13:30 - 16:45
Tue 31. August 2021, 9:15 - 12:30 and 13:30 - 16:45
Wed 1. September 2021, 9:15 - 12:30

Practical part Group 1 (ON SITE, room UZA2U120):
Tue 7. September 2021, 9:15 - 12:30 and 13:30 - 16:45
Wed 8. September 2021, 9:15 - 12:30 and 13:30 - 16:45
Thu 9. September 2021, 9:15 - 12:30

Later changes according to the ongoing COVID-19 situation are possible!

  • Tuesday 16.03. 15:30 - 16:30 Digital

Information

Aims, contents and method of the course

The students have become acquainted with the special theoretical and practical instrumental characteristics of field-emission scanning electron microscopy at high spatial resolution, and with application methods of the focused ion beam (FIB). The students autonomously generate electron optical images at high spatial resolution using various detectors (SED, BSED, FSD, STEM), and they learn to prepare FIB cross sections. Furthermore, the students gain insight into the practical application of the EBSD method. They are able to use the different methods for microstructure and texture analysis at high spatial resolution for answering research questions in the field of Earth sciences.

Assessment and permitted materials

Attendance of all practical parts is required to receive a positive mark.
During the practical part each student autonomously generates an SE- and BSE-image after adjusting all required electron beam settings (UE-SEM), and a cross section using the focused ion beam (UE-FIB). Furthermore, a written workflow protocol has to be prepared, which covers all methods that are treated in the practical part (Submission of the workflow protocol until 26. September 2021).

Minimum requirements and assessment criteria

Attendance of all practical parts is required to receive a positive degree.
All points received for the items of work (UE-SEM, UE-FIB, workflow protocol) are summed to determine the final grade:
Workflow-Protokoll (max 60 Punkte)
UE-SEM (max 20 Punkte)
UE-FIB (max 20 Punkte)
Total points yielding a positive degree: 100 points maximum, 50 points minimum.
Rating:
100-89 points (grade 1)
88-76 points (grade 2)
75-63 points (grade 3)
62-50 points (grade 4)
49-0 points (grade 5)

Examination topics

Individual work under supervision at the Quanta 3D FEG instrument (preparation of SE- and BSE-images; generation of a cross section using the focused ion beam)
Preparation of a workflow protocol covering all practical parts

Reading list

Association in the course directory

Last modified: Fr 12.05.2023 00:22