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280122 UE MA-ERD-W-3.3 Field Emission Ecanning Electron Microscopy and Ion Beam Applications (PI) (2021W)
Continuous assessment of course work
Labels
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Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from We 08.09.2021 10:00 to We 29.09.2021 23:59
- Registration is open from Fr 01.10.2021 10:00 to We 13.10.2021 23:59
- Deregistration possible until We 13.10.2021 23:59
Details
max. 10 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
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18.01.2022 schedule UPDATE
theory part
01.02.2022, 9:30 - 12:00 and 13:15 - 14:30 (Moodle-Zoom)
practical parts (UZA2U120)
15.02. to 18.02.2022, each day 9:15 - 12:15 und 13:30 - 16:30 (compulsory)
21.02.2022, 9:15 - 12:15 and 13:30 - 16:30 (optional)
In addition to the current COVID-19 rules of the University of Vienna, all participants are asked to provide a currently valid negative COVID-19 test certificate (certified antigen-test max 24h, or certified PCR test max 48h) during attendance of the practical parts.
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theory part
27.01.2022, 9:30 - 12:00 and 13:15 - 14:30 (compulsory)
practical parts (UZA2U120)
01.02. to 04.02.2022, each day 9:15 - 12:15 and 13:30 - 16:30 (compulsory) and
15.02.2022, 9:15 - 12:15 and 13:30 - 16:30 (optional)Changes according to the current COVID-19 situation are possible.
- Monday 18.10. 15:30 - 16:30 Seminarraum Paläontologie "Melchior Neumayr" 2A502 5.OG UZA II (Kickoff Class)
Information
Aims, contents and method of the course
Assessment and permitted materials
Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 6. April 2022
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 6. April 2022
Minimum requirements and assessment criteria
Permanent attendance during the practicals is required for a positive certificate.
Assessment criteria: Originally composed workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
Submission of the workflow protocol until 6. April 2022
Assessment criteria: Originally composed workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
Submission of the workflow protocol until 6. April 2022
Examination topics
practicals: individual work under supervision at the Quanta 3D FEG instrument;
Original composition of a workflow-protocol covering the practical parts.
Original composition of a workflow-protocol covering the practical parts.
Reading list
Association in the course directory
Last modified: Fr 01.04.2022 09:09
Students have become acquainted with the special instrumental features of field emission scanning electron microscopy in theory and in practice, and are familiar with focused ion beam (FIB) applications. The students collect electron optical images at high spatial resolution using various detectors (SED, BSED, FSD, STEM) and learn to generate cross-sections using FIB. Furthermore, the students have received insight into the practical application of the EBSD method. They are able to use the different methods of microstructure and texture analysis at high spatial resolution for working at individual questions in geomaterials research.Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; usage of the micromanipulator; EBSD; FSD