280122 UE MA-ERD-W-3.3 Field Emission Scanning Electron Microscopy and Ion Beam Applications (PI) (2022W)
Continuous assessment of course work
Labels
ON-SITE
Registration/Deregistration
Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).
- Registration is open from Mo 05.09.2022 00:00 to We 28.09.2022 23:59
- Registration is open from Mo 03.10.2022 00:00 to We 12.10.2022 23:59
- Deregistration possible until Su 16.10.2022 23:59
Details
max. 10 participants
Language: German, English
Lecturers
Classes (iCal) - next class is marked with N
preliminary meeting 18. Oct 2022, 15:00 - 16:00, room UZA 2A205
Attendance at the preliminary meeting is compulsory!
block course 14. - 22. February 2023
FIB-FESEM laboratory UZA 2U120
- Tuesday 18.10. 15:00 - 16:00 Mikroskopiepraktikum Geowissenschaften 2A205 2.OG UZA II
- Tuesday 14.02. 09:30 - 12:00 Friedrich Becke Seminarraum 2C315 3.OG UZA II
- Tuesday 14.02. 13:15 - 14:30 Friedrich Becke Seminarraum 2C315 3.OG UZA II
Information
Aims, contents and method of the course
Assessment and permitted materials
Permanent attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 11. April 2023
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 11. April 2023
Minimum requirements and assessment criteria
Permanent attendance during the practicals is required for a positive certificate.
Assessment criteria: Originally composed workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
Submission of the workflow protocol until 11. April 2023
Assessment criteria: Originally composed workflow protocol of the practicals (max 60 scores); UE SEM (max 20 scores); UE FIB (max 20 scores); Total scores for positive degree: maximum 100 scores, minimum 50 scores
Submission of the workflow protocol until 11. April 2023
Examination topics
practicals: individual work under supervision at the Quanta 3D FEG instrument;
Original composition of a workflow-protocol covering the practical parts.
Original composition of a workflow-protocol covering the practical parts.
Reading list
Association in the course directory
Last modified: Th 31.10.2024 00:16
Students have become acquainted with the special instrumental features of field emission scanning electron microscopy in theory and in practice, and are familiar with focused ion beam (FIB) applications. The students collect electron optical images at high spatial resolution using various detectors (SED, BSED, FSD, STEM) and learn to generate cross-sections using FIB. Furthermore, the students have received insight into the practical application of the EBSD method. They are able to use the different methods of microstructure and texture analysis at high spatial resolution for working at individual questions in geomaterials research.Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; usage of the micromanipulator; EBSD; FSD