Universität Wien
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280122 UE Field Emission Scanning Electron Microscopy and Ion Beam Applications (2024W)

3.00 ECTS (3.00 SWS), SPL 28 - Erdwissenschaften, Meteorologie - Geophysik und
Continuous assessment of course work
Moodle
Mo 17.02. 09:30-12:00 Seminarraum Paläontologie 2B311 3.OG UZA II

Registration/Deregistration

Note: The time of your registration within the registration period has no effect on the allocation of places (no first come, first served).

Details

max. 10 participants
Language: German, English

Lecturers

Classes (iCal) - next class is marked with N

Preliminary meeting on 23. October 2024, 15:00-16:00 (room UZA 2B311)
Attendance of the preliminary meeting is compulsory for all participants!!!

The course will be held as block course on site. Expectedly, the course will be scheduled in the period 12.-21. February 2025. The date will be fixed in agreement with the participants during the preliminary meeting.

  • Wednesday 23.10. 15:00 - 16:00 Seminarraum Paläontologie 2B311 3.OG UZA II (Kickoff Class)
  • Monday 17.02. 13:15 - 14:30 Seminarraum Paläontologie 2B311 3.OG UZA II

Information

Aims, contents and method of the course

Aims:
Students have become acquainted with the special instrumental features of field emission scanning electron microscopy in theory and in practice, and are familiar with focused ion beam (FIB) applications. The students collect electron optical images at high spatial resolution using various detectors (SED, BSED, FSD, STEM) and learn to generate cross-sections using FIB. Furthermore, the students have received insight into the practical application of the EBSD method. They are able to use the different methods of microstructure and texture analysis at high spatial resolution for working at individual questions in geomaterials research.

Content:
theoretical introduction: Special features of the Quanta 3D FEG instrument (E-gun and E-column, FIB, detectors)
practicals at the Quanta 3D FEG instrument: Hardware; Software; sample exchange; Secondary Electron and Back Scattered Electron imaging; STEM imaging; EDX; FIB; Gas injection systems; usage of the micromanipulator; EBSD; FSD

Assessment and permitted materials

Attendance during the practicals is required for a positive certificate.
During the practicals every student independently collects SE- and BSE-images after setting the required electron beam parameters (UE SEM) and generates a cross-section using the focused ion beam (UE FIB).
Assessment criteria: active participation during the practicals; originally composed workflow protocol of all parts of the practicals.
Submission of the workflow protocol until 31. March 2025

Minimum requirements and assessment criteria

Permanent attendance of the practicals is required for a positive certificate.
Assessment criteria:
- active participation during the practicals: UE SEM (max 20 scores); UE FIB (max 20 scores)
- originally composed workflow protocol of the practicals (max 60 scores). Submission of the workflow protocol until 31. March 2025.

The received scores for the practical parts and the workflow protocol will be summed up.
Total scores for positive degree: maximum 100 scores, minimum 50 scores

Rating:
100-89 points (grade 1)
88-76 points (grade 2)
75-63 points (grade 3)
62-50 points (grade 4)
49-0 points (grade 5)

Examination topics

Individual work under supervision at the Quanta 3D FEG instrument during practicals.
Original composition of a workflow-protocol covering all parts of the practicals.

Reading list

Association in the course directory

MA-ERD-W3.3

Last modified: Th 31.10.2024 19:46