300218 UE Scanning electron microscopy - techniques and preparations for biologists (2022W)
Labels
Registration/Deregistration
- Registration is open from Th 08.09.2022 14:00 to Th 22.09.2022 18:00
- Deregistration possible until Mo 31.10.2022 18:00
Details
Lecturers
Classes (iCal) - next class is marked with N
Online preliminary meeting 21.11.2022 10:00. I will send the link in time.
The lecture for the course will take place on December 1st, 2022 in seminar room 1.1 PC.
Sample preparation will take place for everyone on December 2nd, 2022 and December 6th, 2022 in the EM laboratory of the Core Facility Cell Imaging and Ultrastructural Research (attendance required).
Training on the two scanning electron microscopes and energy-dispersive X-ray microanalysis will take place on December 7th, 2022 and December 9th, 2022. (Mandatory attendance)
From December 13th to 15th, free work will take place on the scanning electron microscopes. You will be able to choose time slots for these 3 days in the preliminary meeting.
On 16.12. the final meeting of the course takes place (attendance is compulsory).
- Thursday 01.12. 08:00 - 14:45 Seminarraum 1.1 PC, Biologie Djerassiplatz 1, 1.003, Ebene 1
Information
Aims, contents and method of the course
Assessment and permitted materials
1) Moodle Test - Safety instructions for the EM Lab (has to be done before practical work)
2) Cooperation
3) Short Presentation
4) Worksheets
Minimum requirements and assessment criteria
Safety instructions 25 points
Cooperation 25 points
Short presentation 25 points
Worksheets 25 points0 - 50 points 5
51 - 67 points 4
67 - 81 points 3
82 - 90 points 2
91 - 100 points 1
Our Scanning Electron Microscopes (SEM) offer various techniques to investigate samples.
In this course you will have the opportunity to learn the necessary preparation steps and the usage of the SEM in several modes so that you can apply these techniques with your own samples afterwards.
On the SEM you will use the following modes:
Secondary electron detector in low vacuum and high vacuum, backscatter electron detector in low vacuum and high vacuum, energy dispersive x-ray micro analysis with EDX detector.